Vulnerabilities

CVE-2024-43050 | BDVDB-2026-257355 Detail

QualcommSnapdragon

Description#

Memory corruption while invoking IOCTL calls from user space to issue factory test command inside WLAN driver.

Impact#

Per CVSS v3.1: confidentiality impact high, integrity impact high, availability impact high. Attack vector: local.

Weaknesses#

CWE-121 Stack-based Buffer Overflow

References#

https://docs.qualcomm.com/product/publicresources/securitybulletin/december-2024-bulletin.html

Exploit#

No public exploit known

History#

Version 12024-12-02Record published in the CVE List.
Version 22024-12-03Most recent update recorded in the CVE List.

Published

Published: 2024-12-02
Last modified: 2024-12-03

Vendor information

Vendor: Qualcomm
Product: Snapdragon

All Qualcomm vulnerabilities

Score

7.8 High

EPSS

less than 1%, Very Low

Estimated chance of exploitation in the next 30 days. EPSS percentile: 1.0.

KEV

No

Not listed in the CISA Known Exploited Vulnerabilities catalog.

Impact

Not classified

Action

No specific action is recorded in the source data. Check the references for vendor guidance.

Affected Systems

Vulnerable
AQT1000
Fixed
Not stated
Vulnerable
FastConnect 6200
Fixed
Not stated
Vulnerable
FastConnect 6700
Fixed
Not stated
Vulnerable
FastConnect 6800
Fixed
Not stated
Vulnerable
FastConnect 6900
Fixed
Not stated
Vulnerable
FastConnect 7800
Fixed
Not stated
Vulnerable
QCA1062
Fixed
Not stated
Vulnerable
QCA1064
Fixed
Not stated

Scoring System

CVSS v4.0

Not available

CVSS v3.1

7.8 High

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Metric breakdown
Attack Vector	Local
Attack Complexity	Low
Privileges Required	Low
User Interaction	None
Scope	Unchanged
Confidentiality	High
Integrity	High
Availability	High

CVSS v3.0

Not available

CVSS v2

Not available

Source: CVE List v5 (record); CISA KEV (kev, action); FIRST EPSS (epss).