CVE-2022-25696 | BDVDB-2026-184656 Detail
QualcommSnapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Description#
Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Impact#
Per CVSS v3.1: confidentiality impact high, integrity impact high, availability impact high. Attack vector: local.
Weaknesses#
No weakness recorded in the source data.
References#
Exploit#
No public exploit known
History#
- Version 1Record published in the CVE List.
- Version 2Most recent update recorded in the CVE List.