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Vulnerabilities

CVE-2022-38155 | BDVDB-2026-182255 Detail

Description#

TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.

Impact#

No impact statement in the source data.

Weaknesses#

No weakness recorded in the source data.

References#

Exploit#

No public exploit known

History#

  1. Version 1Record published in the CVE List.
  2. Version 2Most recent update recorded in the CVE List.