CVE-2022-38155 | BDVDB-2026-182255 Detail
Description#
TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
Impact#
No impact statement in the source data.
Weaknesses#
No weakness recorded in the source data.
References#
Exploit#
No public exploit known
History#
- Version 1Record published in the CVE List.
- Version 2Most recent update recorded in the CVE List.