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Vulnerabilities

CVE-2022-35858 | BDVDB-2026-181560 Detail

Description#

The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.

Impact#

No impact statement in the source data.

Weaknesses#

No weakness recorded in the source data.

References#

Exploit#

No public exploit known

History#

  1. Version 1Record published in the CVE List.
  2. Version 2Most recent update recorded in the CVE List.